Apogee Semiconductor AP54RHC164 Radiation-Hardened SIPO Shift Registers
Apogee Semiconductor AP54RHC164 Radiation-Hardened 8-bit Serial-In Parallel-Out (SIPO) Shift Registers are members of the AP54RHC logic family. These shift registers operate within the 1.65VDC to 5.5VDC supply voltage range. The AP54RHC164 shift registers deliver high resiliency to Single-Event Effects (SEE) and up to Total Ionizing Dose (TID) resilience of 30krad (Si). These registers feature proprietary cold-sparing capability with zero static power penalty. The AP54RHC164 registers also feature a triple-redundant design, which allows the devices to be immune to Single-Event Transients (SET). The AP54RHC164ALT-R shift registers are flight-A grade, and the AP54RHC164ELT-R registers are evaluation grade. These registers are used in medical imaging, small satellites, and Leo constellations.
The AP54RHC164 registers include an internal Power-On Reset (POR) circuit that ensures reliable power-up and power-down responses during cold-sparing and hot plug operations. These shift registers are used in space, medical imaging, and applications that require radiation tolerance.
Features
- 1.65VDC to 5.5VDC supply voltage range
- Inputs tolerant up to 5.5VDC at any VCC
- 30krad (Si) Total Ionizing Dose (TID) resilience
- Single Event Latchup (SEL) resilient up to LET of 80MeV-cm2/mg
- Fabricated in a 180nm CMOS process using proprietary radiation hardening techniques
- -55°C to 125°C extended operating temperature range
- Provides logic-level down translation to VCC
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability
- Class 2 ESD protection (4000V HBM and 500V CDM)
Applications
- Space
- Medical imaging
- Leo constellations
Logic Diagram
發佈日期: 2024-08-26
| 更新日期: 2025-03-06