Texas Instruments DLPLCR55EVM Evaluation Module
Texas Instruments DLPLCR55EVM Evaluation Module features the DLP5500 0.55" 2 x LVDS DMD, including 1024 x 768 micromirrors with 10.8µm pitch. Users can combine the DLPLCR55EVM and DLPLCRC900EVM to get a pixel-accurate control with 1-bit pattern rates up to 5,000Hz. The TI DLPLCR55EVM is ideal for designers requiring the highest resolution DMD and advanced pattern control.
Features
- Targets 420nm to 700nm with 1-bit pattern rates up to 5,000Hz
- DLP5500 DMD has 1024 x 768 mirrors with 10.8µm pitch
- DMD board with holes for convenient mounting
- One 12" flex cable for flexible positioning of the DMD on a benchtop
Applications
- Structured light applications
- Factory automation and 3D machine vision
- In-line automated optical 3D inspection
- Robotic 3D vision
- Offline 3D metrology
- 3D scanners
- 3D identification and biometrics
- 3D printing and additive manufacturing
- Medical and life sciences
- High-speed imaging and display
Kit Contents
- DLPLCR55EVM Evaluation Module
- Flex cable
Layout
Additional Resources
Associated Products
Texas Instruments DLP DMD Evaluation Modules (EVMs)
Subsystem to evaluate the DLP500, DLP650, DLP670, and DLP900 digital micromirror devices (DMD).
發佈日期: 2023-10-26
| 更新日期: 2025-03-05